M. J. Bellido

2 references under this name, matched as it is written. Somebody else may write under it too, and the same person may appear here spelled another way.

Characterization of Normal Propagation Delay for Delay Degradation Model (DDM)

A. Millan and others (2002) · Springer Berlin Heidelberg

Degradation Delay Model Extension to CMOS Gates

J. Juan-Chico and others (2000) · Springer Berlin Heidelberg