The bibliographic entry was discovered and compiled by a machine, and published without a person checking it against the publication. The publication itself is the authors' own work — this badge says nothing about it.

Microarchitecture-aware Fault Models: Experimental Evidence and Cross-Layer Inference Methodology

The work

AuthorsIhab Alshaer; Brice Colombier; Christophe Deleuze; Vincent Beroulle; Paolo Maistri
Editors
Typemisc
Year2021
Citekeyalshaer2021microarchitectureaware

Where it appeared

Published inInternational Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
Pages1--6

From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.

Abstract

Fault injection attacks are considered one of the major threats to cyber-physical systems. The increasing complexity of embedded microprocessors involves complicated behaviours in presence of such attacks. Realistic fault models are required to study code vulnerabilities and be able to protect digital systems from these attacks. However, inferring fault models using only limited observations of faulty microprocessors is difficult. In this article, we present experiments that show the difficulty of characterizing and modelling the fault injection effects. From there, we propose a complete approach for fault analysis to build proper fault models at different system levels, which will help in designing suitable countermeasures at reasonable cost.

How it got here

How it got hereagent via openalex
Added2026-10-26 15:52 UTC
Not denied bya person 2026-10-29 17:12 UTC

Cite it as

@misc{alshaer2021microarchitectureaware,
  title        = {Microarchitecture-aware Fault Models: Experimental Evidence and Cross-Layer Inference Methodology},
  author       = {Ihab Alshaer and Brice Colombier and Christophe Deleuze and Vincent Beroulle and Paolo Maistri},
  year         = {2021},
  journal      = {International Conference on Design \& Technology of Integrated Systems in Nanoscale Era (DTIS)},
  pages        = {1--6},
  doi          = {10.1109/dtis53253.2021.9505074},
}

This record lives at https://refs.drheap.org/alshaer2021microarchitectureaware/ and will keep doing so.