Complementary Formal Approaches for Dependability Analysis
The work
| Authors | Souheib Baarir; Cécile Braunstein; Renaud Clavel; Emmanuelle Encrenaz; Jean‐Michel Ilié; R. Leveugle; Isabelle Mounier; Laurence Pierre; Denis Poitrenaud |
|---|---|
| Editors | |
| Type | misc |
| Year | 2009 |
| Citekey | baarir2009complementary |
Where it appeared
| Published in | Proceedings |
|---|---|
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 331--339 |
Identifiers
| DOI | 10.1109/dft.2009.21 |
|---|---|
| OpenAlex | W2139404439 |
Access
| Landing page | https://doi.org/10.1109/dft.2009.21 |
|---|
From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.
Abstract
Evaluating the robustness of digital circuits with respect to soft errors has become an important part of the design flow for many applications. The identification of the most or less critical registers is often necessary, in order to reach the lowest overheads while achieving a given application-level robustness. The goal here is to identify those soft errors actually harmful for the system, not to compute the Soft Error Rate. In this context, we investigate new approaches based on formal techniques to improve design-time robustness evaluations at least for the most critical blocks in a circuit. Preliminary results are shown, focusing on the evaluation of self-healing (or self-repairing) capabilities.
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-26 02:21 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@misc{baarir2009complementary,
title = {Complementary Formal Approaches for Dependability Analysis},
author = {Souheib Baarir and Cécile Braunstein and Renaud Clavel and Emmanuelle Encrenaz and Jean‐Michel Ilié and R. Leveugle and Isabelle Mounier and Laurence Pierre and Denis Poitrenaud},
year = {2009},
journal = {Proceedings},
publisher = {Institute of Electrical and Electronics Engineers},
pages = {331--339},
doi = {10.1109/dft.2009.21},
}
This record lives at https://refs.drheap.org/baarir2009complementary/ and will keep doing so.