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Microcontroller Compiler-Assisted Software Fault Tolerance

The work

AuthorsMatthew Kendall Bohman; Benjamin James; Michael Wirthlin; Heather Quinn; Jeffrey B. Goeders
Editors
Typearticle
Year2018
Citekeybohman2018microcontroller

Where it appeared

Published inIEEE Transactions on Nuclear Science
PublisherInstitute of Electrical and Electronics Engineers
Volume66
Issue1
Pages223--232

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Abstract

Commercial off-the-shelf microcontrollers can be useful for noncritical processing on spaceborne platforms. These microprocessors can be inexpensive and consume small amounts of power. However, the software running on these processors is vulnerable to radiation upsets. In this paper, we present a fully automated, configurable, software-based tool to increase the reliability of microprocessors in high-radiation environments. This tool consists of a set of open-source LLVM compiler passes to automatically implement software-based mitigation techniques. We duplicate or triplicate computations and insert voting mechanisms into software during the compilation process, allowing for runtime error correction. While the techniques we implement are not novel, previous work has typically been closed source, processor architecture dependent, not automated, and not tested in real high-radiation environments. In contrast, the compiler passes presented in this paper are publicly available, highly customizable, and are platform independent and language independent. We have tested our modified software using both fault injection and through neutron beam radiation on a Texas Instruments MSP430 microcontroller. When tested by a neutron beam, we were able to decrease the cross section of programs by 17-29×, increasing mean-work-to-failure by 4-7×.

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Added2026-10-26 15:58 UTC
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Cite it as

@article{bohman2018microcontroller,
  title        = {Microcontroller Compiler-Assisted Software Fault Tolerance},
  author       = {Matthew Kendall Bohman and Benjamin James and Michael Wirthlin and Heather Quinn and Jeffrey B. Goeders},
  year         = {2018},
  journal      = {IEEE Transactions on Nuclear Science},
  publisher    = {Institute of Electrical and Electronics Engineers},
  volume       = {66},
  number       = {1},
  pages        = {223--232},
  doi          = {10.1109/tns.2018.2886094},
}

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