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Trends and challenges in VLSI circuit reliability
The work
| Authors | Cris S. Constantinescu |
|---|---|
| Editors | |
| Type | article |
| Year | 2003 |
| Citekey | constantinescu2003trends |
Where it appeared
| Published in | IEEE Micro |
|---|---|
| Publisher | Institute of Electrical and Electronics Engineers |
| Volume | 23 |
| Issue | 4 |
| Pages | 14--19 |
Identifiers
| DOI | 10.1109/mm.2003.1225959 |
|---|---|
| OpenAlex | W2017521824 |
Access
| Landing page | https://doi.org/10.1109/mm.2003.1225959 |
|---|
From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.
Abstract
Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-27 08:48 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@article{constantinescu2003trends,
title = {Trends and challenges in VLSI circuit reliability},
author = {Cris S. Constantinescu},
year = {2003},
journal = {IEEE Micro},
publisher = {Institute of Electrical and Electronics Engineers},
volume = {23},
number = {4},
pages = {14--19},
doi = {10.1109/mm.2003.1225959},
}
This record lives at https://refs.drheap.org/constantinescu2003trends/ and will keep doing so.