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A logic design structure for LSI testability
The work
| Authors | E. B. Eichelberger; T. W. Williams |
|---|---|
| Editors | |
| Type | misc |
| Year | 1988 first published 1977 |
| Citekey | eichelberger1988logic |
Where it appeared
| Published in | Papers on Twenty-five years of electronic design automation |
|---|---|
| Publisher | ACM |
| Pages | 358--364 |
Identifiers
| DOI | 10.1145/62882.62924 |
|---|---|
| OpenAlex | W4253405466 |
Access
| Landing page | https://doi.org/10.1145/62882.62924 |
|---|---|
| Free full text | https://dl.acm.org/doi/pdf/10.1145/62882.62924 |
From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.
Abstract
Advantages and cost impact will also be discussed qualitatively.1.
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-23 00:15 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@misc{eichelberger1988logic,
title = {A logic design structure for LSI testability},
author = {E. B. Eichelberger and T. W. Williams},
year = {1988},
note = {first published 1977},
journal = {Papers on Twenty-five years of electronic design automation},
publisher = {ACM},
pages = {358--364},
doi = {10.1145/62882.62924},
}
This record lives at https://refs.drheap.org/eichelberger1988logic/ and will keep doing so.