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An on-chip glitchy-clock generator for testing fault injection attacks

The work

AuthorsSho Endo; Takeshi Sugawara; Naofumi Homma; Takafumi Aoki; Akashi Satoh
Editors
Typearticle
Year2011
Citekeyendo2011onchip

Where it appeared

Published inJournal of Cryptographic Engineering
PublisherSpringer Science and Business Media LLC
Volume1
Issue4
Pages265--270

Identifiers

DOI10.1007/s13389-011-0022-y
ISSN2190-8508

How it got here

How it got hereagent via crossref
Added2026-10-26 05:35 UTC
Not denied bya person 2026-10-29 17:12 UTC

Filed under

hardware-security

Cite it as

@article{endo2011onchip,
  title        = {An on-chip glitchy-clock generator for testing fault injection attacks},
  author       = {Sho Endo and Takeshi Sugawara and Naofumi Homma and Takafumi Aoki and Akashi Satoh},
  year         = {2011},
  journal      = {Journal of Cryptographic Engineering},
  publisher    = {Springer Science and Business Media LLC},
  volume       = {1},
  number       = {4},
  pages        = {265--270},
  issn         = {2190-8508},
  doi          = {10.1007/s13389-011-0022-y},
}

This record lives at https://refs.drheap.org/endo2011onchip/ and will keep doing so.