Symbolic quick error detection using symbolic initial state for pre-silicon verification
The work
| Authors | Mohammad Rahmani Fadiheh; Joakim Urdahl; Srinivasa Shashank Nuthakki; Subhasish Mitra; Clark Barrett; Dominik Stoffel; Wolfgang Kunz |
|---|---|
| Editors | |
| Type | misc |
| Year | 2018 |
| Citekey | fadiheh2018symbolic |
Where it appeared
| Published in | Design, Automation, and Test in Europe |
|---|---|
| Pages | 55--60 |
Identifiers
| DOI | 10.23919/date.2018.8341979 |
|---|---|
| OpenAlex | W2798765367 |
Access
| Landing page | https://doi.org/10.23919/date.2018.8341979 |
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Abstract
Driven by the demand for highly customizable processor cores for IoT and related applications, there is a renewed interest in effective but low-cost techniques for verifying systems-on-chip (SoCs). This paper revisits the problem of processor verification and presents a radically different approach when compared to the state of the art. The proposed approach is highly automated and leverages recent progress in the field of post-silicon validation by the method of Quick Error Detection (QED) and Symbolic Quick Error Detection (SQED). In this paper, we modify SQED by incorporating a symbolic initial state in its BMC-based analysis and generalize the approach into the S2QED method. As a first advantage, S2QED can separate logic bugs from electrical bugs in QED-based postsilicon validation. Secondly, it also makes a strong contribution to pre-silicon verification by proving that the execution of each instruction is independent of its context in the program. The manual efforts for the proposed approach are orders of magnitude smaller than for conventional property checking. Our experimental results demonstrate the potential of S2QED using the Aquarius open-source processor example.
Cite it as
@misc{fadiheh2018symbolic,
title = {Symbolic quick error detection using symbolic initial state for pre-silicon verification},
author = {Mohammad Rahmani Fadiheh and Joakim Urdahl and Srinivasa Shashank Nuthakki and Subhasish Mitra and Clark Barrett and Dominik Stoffel and Wolfgang Kunz},
year = {2018},
journal = {Design, Automation, and Test in Europe},
pages = {55--60},
doi = {10.23919/date.2018.8341979},
}
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