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Gate Oxide Reliability: Physical and Computational Models
The work
| Authors | A. Ghetti |
|---|---|
| Editors | |
| Type | misc |
| Year | 2004 |
| Also known as | anon2004gate |
| Citekey | ghetti2004gate |
Where it appeared
| Publisher | Springer Berlin Heidelberg |
|---|
Identifiers
| DOI | 10.1007/978-3-662-09432-7_6 |
|---|
How it got here
| How it got here | agent via unpaywall |
|---|---|
| Added | 2026-10-26 17:34 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@misc{ghetti2004gate,
title = {Gate Oxide Reliability: Physical and Computational Models},
author = {A. Ghetti},
year = {2004},
publisher = {Springer Berlin Heidelberg},
doi = {10.1007/978-3-662-09432-7_6},
}
This record lives at https://refs.drheap.org/ghetti2004gate/ and will keep
doing so. It used to be called anon2004gate, and those addresses still resolve to this one.