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Exploring Variability and Performance in a Sub-200-mV Processor

Where it appeared

Published inIEEE Journal of Solid-State Circuits
PublisherInstitute of Electrical and Electronics Engineers
Volume43
Issue4
Pages881--891

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Abstract

In this study, we explore the design of a subthreshold processor for use in ultra-low-energy sensor systems. We describe an 8-bit subthreshold processor that has been designed with energy efficiency as the primary constraint. The processor, which is functional below Vdd=200 mV, consumes only 3.5 pJ/inst at Vdd=350 mV and, under a reverse body bias, draws only 11 nW at Vdd=160 mV. Process and temperature variations in subthreshold circuits can cause dramatic fluctuations in performance and energy consumption and can lead to robustness problems. We investigate the use of body biasing to adapt to process and temperature variations. Test-chip measurements show that body biasing is particularly effective in subthreshold circuits and can eliminate performance variations with minimal energy penalties. Reduced performance is also problematic at low voltages, so we investigate global and local techniques for improving performance while maintaining energy efficiency.

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Added2026-10-27 19:21 UTC
Not denied bya person 2026-10-29 17:12 UTC

Cite it as

@article{hanson2008exploring,
  title        = {Exploring Variability and Performance in a Sub-200-mV Processor},
  author       = {Scott Hanson and Bo Zhai and Mingoo Seok and Brian T. Cline and Kevin Zhou and Meghna Singhal and Michael Minuth and Javin Olson and Leyla Nazhandali and Todd M. Austin and Dennis Sylvester and David Blaauw},
  year         = {2008},
  journal      = {IEEE Journal of Solid-State Circuits},
  publisher    = {Institute of Electrical and Electronics Engineers},
  volume       = {43},
  number       = {4},
  pages        = {881--891},
  doi          = {10.1109/jssc.2008.917505},
}

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