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Identifying and Measuring Security Critical Path for Uncovering Circuit Vulnerabilities

The work

AuthorsWei Hu; Armaiti Ardeshiricham; Ryan Kastner
Editors
Typeinproceedings
Year2017
Citekeyhu2017identifying

Where it appeared

Published in2017 18th International Workshop on Microprocessor and SOC Test and Verification (MTV)
PublisherIEEE
Pages62--67

Identifiers

DOI10.1109/mtv.2017.11

How it got here

How it got hereagent via crossref
Added2026-10-23 18:52 UTC
Not denied bya person 2026-10-29 17:12 UTC

Cite it as

@inproceedings{hu2017identifying,
  title        = {Identifying and Measuring Security Critical Path for Uncovering Circuit Vulnerabilities},
  author       = {Wei Hu and Armaiti Ardeshiricham and Ryan Kastner},
  year         = {2017},
  booktitle    = {2017 18th International Workshop on Microprocessor and SOC Test and Verification (MTV)},
  publisher    = {IEEE},
  pages        = {62--67},
  doi          = {10.1109/mtv.2017.11},
}

This record lives at https://refs.drheap.org/hu2017identifying/ and will keep doing so.