Experimental Analysis of the Electromagnetic Instruction Skip Fault Model
The work
| Authors | Alexandre Menu; Jean-Max Dutertre; Olivier Potin; Jean-Baptiste Rigaud; Jean‐Luc Danger |
|---|---|
| Editors | |
| Type | misc |
| Year | 2020 |
| Citekey | menu2020experimental |
Where it appeared
| Pages | 1--7 |
|---|
Identifiers
| DOI | 10.1109/dtis48698.2020.9081261 |
|---|---|
| OpenAlex | W3023546199 |
Access
| Landing page | https://doi.org/10.1109/dtis48698.2020.9081261 |
|---|
From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.
Abstract
Microcontrollers storing valuable data or using security functions are vulnerable to fault injection attacks. Among the various types of faults, instruction skips induced at runtime proved to be effective against identification routines or encryption algorithms. Until recently, most research works assessed a fault model that consists in a single instruction skip, i.e. the ability to prevent one chosen instruction in a program from being executed. We question this fault model for EM fault injection on experimental basis and report the possibility to induce several consecutive instructions skips.
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-26 05:49 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@misc{menu2020experimental,
title = {Experimental Analysis of the Electromagnetic Instruction Skip Fault Model},
author = {Alexandre Menu and Jean-Max Dutertre and Olivier Potin and Jean-Baptiste Rigaud and Jean‐Luc Danger},
year = {2020},
pages = {1--7},
doi = {10.1109/dtis48698.2020.9081261},
}
This record lives at https://refs.drheap.org/menu2020experimental/ and will keep doing so.