Dan Alexandrescu
2 references under this name, matched as it is written. Somebody else may write under it too, and the same person may appear here spelled another way.
Detailed SET Measurement and Characterization of a 65 nm Bulk Technology
Maximilien Glorieux and others (2017) · IEEE Transactions on Nuclear Science · Institute of Electrical and Electronics Engineers
Evaluation of a soft error tolerance technique based on time and/or space redundancy
Lorena Anghel and others (2000) · Symposium on Integrated Circuits and Systems Design