David Hély

2 references under this name, matched as it is written. Somebody else may write under it too, and the same person may appear here spelled another way.

Exposing Data Value On a Risc-V Based SoC

Ezinam Bertrand Talaki and others (2021) · IEEE Physical Assurance and Inspection of Electronics (PAINE)

Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model

Jean-Max Dutertre and others (2018) · Workshop on Fault Diagnosis and Tolerance in Cryptography