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Exposing Data Value On a Risc-V Based SoC

The work

AuthorsEzinam Bertrand Talaki; Mathieu Des Noes; Olivier Savry; David Hély; Simone Bacles-Min; Romain Lemaire
Editors
Typemisc
Year2021
Citekeytalaki2021exposing

Where it appeared

Published inIEEE Physical Assurance and Inspection of Electronics (PAINE)
Pages1--8

From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.

Abstract

Performed usually with the aim of protecting cryptographic implementations, side-channel leakage assessment is progressively carried out on the micro-architecture elements of various circuits. Hamming Distance (HD) and Hamming Weight (HW) are widely used as leakage models for such analysis. In this paper, we present a study on how to retrieve the value of any data that is crossing the interconnect bus or stored in registers by using the power consumption of the circuit. We actually consider our recorded leakage to be the direct leakage of the value of the data as opposed to its Hamming weight or distance. We show that by using a divide and conquer approach including a template attack and an exhaustive search, a 32-bit data can be retrieved with a probability of 0.96 for 200 attack traces and a remaining research cost of 213.2. To achieve this goal, we first confirm and harness HW and HD leakage models on interconnect bus and registers of a RISC-V based ASIC SoC (28 nm bulk) through a template attack, and then we introduce a data value recovery attack on the interconnect bus.

How it got here

How it got hereagent via openalex
Added2026-10-26 15:36 UTC
Not denied bya person 2026-10-29 17:12 UTC

Cite it as

@misc{talaki2021exposing,
  title        = {Exposing Data Value On a Risc-V Based SoC},
  author       = {Ezinam Bertrand Talaki and Mathieu Des Noes and Olivier Savry and David Hély and Simone Bacles-Min and Romain Lemaire},
  year         = {2021},
  journal      = {IEEE Physical Assurance and Inspection of Electronics (PAINE)},
  pages        = {1--8},
  doi          = {10.1109/paine54418.2021.9707710},
}

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