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Robust system design with built-in soft-error resilience
The work
| Authors | Subhasish Mitra; Norbert Seifert; M. Zhang; Q. Shi; Kun Suk Kim |
|---|---|
| Editors | |
| Type | article |
| Year | 2005 |
| Citekey | mitra2005robust |
Where it appeared
| Published in | Computer |
|---|---|
| Publisher | IEEE Computer Society |
| Volume | 38 |
| Issue | 2 |
| Pages | 43--52 |
Identifiers
| DOI | 10.1109/mc.2005.70 |
|---|---|
| OpenAlex | W2162465831 |
Access
| Landing page | https://doi.org/10.1109/mc.2005.70 |
|---|
From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.
Abstract
Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system's susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors.
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-26 00:05 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Filed under
Cite it as
@article{mitra2005robust,
title = {Robust system design with built-in soft-error resilience},
author = {Subhasish Mitra and Norbert Seifert and M. Zhang and Q. Shi and Kun Suk Kim},
year = {2005},
journal = {Computer},
publisher = {IEEE Computer Society},
volume = {38},
number = {2},
pages = {43--52},
doi = {10.1109/mc.2005.70},
}
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