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PLL to the rescue: a novel EM fault countermeasure

The work

AuthorsNoriyuki Miura; Zakaria Najm; Wei He; Shivam Bhasin; Xuan Thuy Ngo; Makoto Nagata; Jean‐Luc Danger
Editors
Typemisc
Year2016
Citekeymiura2016pll

Where it appeared

Published inProceedings - ACM IEEE Design Automation Conference
PublisherAssociation for Computing Machinery
Pages1--6

Identifiers

DOI10.1145/2897937.2898065
OpenAlexW2401883107

From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.

Abstract

Electromagnetic injection (EMI) is a powerful and precise technique for fault injection in modern ICs. This intentional fault can be utilized to steal secret information hidden inside of ICs. Unlike laser fault injection, tedious package decapsulation is not needed for EMI, which reduces an attacker's cost and thus causes a serious information security threat. In this paper, a PLL-based sensor circuit is proposed to detect EMI reactively on chip. A fully automatic design flow is devised to integrate the proposed sensor together with a cryptographic processor. A high fault detection coverage and a small hardware overhead are demonstrated experimentally on an FPGA platform.

How it got here

How it got hereagent via openalex
Added2026-10-26 05:52 UTC
Not denied bya person 2026-10-29 17:12 UTC

Cite it as

@misc{miura2016pll,
  title        = {PLL to the rescue: a novel EM fault countermeasure},
  author       = {Noriyuki Miura and Zakaria Najm and Wei He and Shivam Bhasin and Xuan Thuy Ngo and Makoto Nagata and Jean‐Luc Danger},
  year         = {2016},
  journal      = {Proceedings - ACM IEEE Design Automation Conference},
  publisher    = {Association for Computing Machinery},
  pages        = {1--6},
  doi          = {10.1145/2897937.2898065},
}

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