A review of fault-tolerant techniques for the enhancement of integrated circuit yield

The work

TitleA review of fault-tolerant techniques for the enhancement of integrated circuit yield
AuthorsW. R. Moore
Typearticle
Year1986
Citekeymoore1986review

Where it appeared

Published inProceedings of the IEEE
Volume74
Issue5
Pages684--698

Identifiers

DOI10.1109/proc.1986.13531

Where this came from

How it got herealready cited · cited in bibtex
First seen2026-08-10
Recordreviewed by a person
Approved2026-08-10

Cite it as

@article{moore1986review,
  title = {A review of fault-tolerant techniques for the enhancement of integrated circuit yield},
  author = {W. R. Moore},
  year = {1986},
  journal = {Proceedings of the IEEE},
  volume = {74},
  number = {5},
  pages = {684--698},
  doi = {10.1109/proc.1986.13531},
}

This record lives at https://refs.drheap.org/moore1986review/ and will keep doing so.