A review of fault-tolerant techniques for the enhancement of integrated circuit yield
The work
| Authors | W. R. Moore |
|---|---|
| Editors | |
| Type | article |
| Year | 1986 |
| Citekey | moore1986review |
Where it appeared
| Published in | Proceedings of the IEEE |
|---|---|
| Volume | 74 |
| Issue | 5 |
| Pages | 684--698 |
Identifiers
| DOI | 10.1109/proc.1986.13531 |
|---|
How it got here
| How it got here | import via bibtex |
|---|---|
| Added | 2026-08-10 00:00 UTC |
| Approved by | a person 2026-08-10 15:18 UTC |
Filed under
Cite it as
@article{moore1986review,
title = {A review of fault-tolerant techniques for the enhancement of integrated circuit yield},
author = {W. R. Moore},
year = {1986},
journal = {Proceedings of the IEEE},
volume = {74},
number = {5},
pages = {684--698},
doi = {10.1109/proc.1986.13531},
}
This record lives at https://refs.drheap.org/moore1986review/ and will keep doing so.