A review of fault-tolerant techniques for the enhancement of integrated circuit yield

The work

AuthorsW. R. Moore
Editors
Typearticle
Year1986
Citekeymoore1986review

Where it appeared

Published inProceedings of the IEEE
Volume74
Issue5
Pages684--698

How it got here

How it got hereimport via bibtex
Added2026-08-10 00:00 UTC
Approved bya person 2026-08-10 15:18 UTC

Cite it as

@article{moore1986review,
  title        = {A review of fault-tolerant techniques for the enhancement of integrated circuit yield},
  author       = {W. R. Moore},
  year         = {1986},
  journal      = {Proceedings of the IEEE},
  volume       = {74},
  number       = {5},
  pages        = {684--698},
  doi          = {10.1109/proc.1986.13531},
}

This record lives at https://refs.drheap.org/moore1986review/ and will keep doing so.