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Electromagnetic Fault Injection: Towards a Fault Model on a 32-bit Microcontroller
The work
| Authors | Nicolas Moro; Amine Dehbaoui; Karine Heydemann; Bruno Robisson; Emmanuelle Encrenaz |
|---|---|
| Editors | |
| Type | inproceedings |
| Year | 2013 |
| Citekey | moro2013electromagnetic |
Where it appeared
| Published in | 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography |
|---|---|
| Publisher | IEEE |
| Pages | 77--88 |
Identifiers
| DOI | 10.1109/fdtc.2013.9 |
|---|
Access
| Landing page | https://doi.org/10.1109/fdtc.2013.9 |
|---|
How it got here
| How it got here | agent via crossref |
|---|---|
| Added | 2026-10-26 05:48 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Filed under
Cite it as
@inproceedings{moro2013electromagnetic,
title = {Electromagnetic Fault Injection: Towards a Fault Model on a 32-bit Microcontroller},
author = {Nicolas Moro and Amine Dehbaoui and Karine Heydemann and Bruno Robisson and Emmanuelle Encrenaz},
year = {2013},
booktitle = {2013 Workshop on Fault Diagnosis and Tolerance in Cryptography},
publisher = {IEEE},
pages = {77--88},
doi = {10.1109/fdtc.2013.9},
}
This record lives at https://refs.drheap.org/moro2013electromagnetic/ and will keep doing so.