Measuring architectural vulnerability factors
The work
| Authors | Shubhendu S. Mukherjee; Christopher T. Weaver; Joel Emer; S.K. Reinhardt; T. Austin |
|---|---|
| Editors | |
| Type | article |
| Year | 2003 |
| Citekey | mukherjee2003measuring |
Where it appeared
| Published in | IEEE Micro |
|---|---|
| Publisher | Institute of Electrical and Electronics Engineers |
| Volume | 23 |
| Issue | 6 |
| Pages | 70--75 |
Identifiers
| DOI | 10.1109/mm.2003.1261389 |
|---|---|
| OpenAlex | W2047171058 |
Access
| Landing page | https://doi.org/10.1109/mm.2003.1261389 |
|---|
From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.
Abstract
The continuous exponential growth in transistors per chip as described by Moore's law has spurred tremendous progress in the functionality and performance of semiconductor devices, particularly microprocessors. At the same time, each succeeding technology generation has introduced new obstacles to maintaining this growth rate. Transient faults caused by single-event upsets have emerged as a key challenge likely to gain significantly more importance in the next few design generations. Techniques for dealing with these faults exist, but they come at a cost. Designers need accurate soft-error estimates early in the design cycle to weigh the benefits of error protection techniques against their costs. This article presents a method for generating these estimates.
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-26 14:41 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@article{mukherjee2003measuring,
title = {Measuring architectural vulnerability factors},
author = {Shubhendu S. Mukherjee and Christopher T. Weaver and Joel Emer and S.K. Reinhardt and T. Austin},
year = {2003},
journal = {IEEE Micro},
publisher = {Institute of Electrical and Electronics Engineers},
volume = {23},
number = {6},
pages = {70--75},
doi = {10.1109/mm.2003.1261389},
}
This record lives at https://refs.drheap.org/mukherjee2003measuring/ and will keep doing so.