A Rapid Fault Injection Approach for Measuring SEU Sensitivity in Complex Processors
The work
| Authors | Marta Portela-Garcia; C. López-Ongil; M. García-Valderas; Luis Entrena |
|---|---|
| Editors | |
| Type | misc |
| Year | 2007 |
| Citekey | portelagarcia2007rapid |
Where it appeared
| Published in | IEEE International On-Line Testing Symposium (IOLTS) |
|---|---|
| Pages | 101--106 |
Identifiers
| DOI | 10.1109/iolts.2007.9 |
|---|---|
| OpenAlex | W2144148609 |
Access
| Landing page | https://doi.org/10.1109/iolts.2007.9 |
|---|
From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.
Abstract
Processors are very common components in current digital systems and to assess their reliability is an essential task during the design process. In this paper a new fault injection solution to measure SEU sensitivity in processors is presented. It consists in a hardware-implemented module that performs fault injection through the available JTAG-based On-Chip Debugger (OCD). It can be widely applicable to different processors since JTAG standard is an extended interface and OCDs are usually available in current processors. The hardware implementation avoids the communication between the target system and the software debugging tool. The method has been applied to a complex processor, the ARM7TDMI. Results illustrate the approach is a fast, efficient and cost-effective solution.
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-26 09:43 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@misc{portelagarcia2007rapid,
title = {A Rapid Fault Injection Approach for Measuring SEU Sensitivity in Complex Processors},
author = {Marta Portela-Garcia and C. López-Ongil and M. García-Valderas and Luis Entrena},
year = {2007},
journal = {IEEE International On-Line Testing Symposium (IOLTS)},
pages = {101--106},
doi = {10.1109/iolts.2007.9},
}
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