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Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells
The work
| Authors | Cyril Roscian; Alexandre Sarafianos; Jean-Max Dutertre; Assia Tria |
|---|---|
| Editors | |
| Type | inproceedings |
| Year | 2013 |
| Citekey | roscian2013fault |
Where it appeared
| Published in | 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography |
|---|---|
| Publisher | IEEE |
| Pages | 89--98 |
Identifiers
| DOI | 10.1109/fdtc.2013.17 |
|---|
Access
| Landing page | https://doi.org/10.1109/fdtc.2013.17 |
|---|
How it got here
| How it got here | agent via crossref |
|---|---|
| Added | 2026-10-26 06:05 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@inproceedings{roscian2013fault,
title = {Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells},
author = {Cyril Roscian and Alexandre Sarafianos and Jean-Max Dutertre and Assia Tria},
year = {2013},
booktitle = {2013 Workshop on Fault Diagnosis and Tolerance in Cryptography},
publisher = {IEEE},
pages = {89--98},
doi = {10.1109/fdtc.2013.17},
}
This record lives at https://refs.drheap.org/roscian2013fault/ and will keep doing so.