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High-level fault injection to assess FMEA on critical systems
The work
| Authors | Julie Roux; Vincent Beroulle; Katell Morin-Allory; R. Leveugle; Lilian Bossuet; Frédéric Cézilly; Frédéric Berthoz; Gilles Genévrier; François Cerisier |
|---|---|
| Editors | |
| Type | article |
| Year | 2021 |
| Citekey | roux2021highlevel |
Where it appeared
| Published in | Microelectronics Reliability |
|---|---|
| Publisher | Elsevier BV |
| Volume | 122 |
| Pages | 114135 |
Identifiers
| DOI | 10.1016/j.microrel.2021.114135 |
|---|---|
| OpenAlex | W3169847557 |
Access
| Landing page | https://doi.org/10.1016/j.microrel.2021.114135 |
|---|---|
| Free full text | https://www.sciencedirect.com/science/article/pii/S0026271421001013 |
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-26 14:23 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@article{roux2021highlevel,
title = {High-level fault injection to assess FMEA on critical systems},
author = {Julie Roux and Vincent Beroulle and Katell Morin-Allory and R. Leveugle and Lilian Bossuet and Frédéric Cézilly and Frédéric Berthoz and Gilles Genévrier and François Cerisier},
year = {2021},
journal = {Microelectronics Reliability},
publisher = {Elsevier BV},
volume = {122},
pages = {114135},
doi = {10.1016/j.microrel.2021.114135},
}
This record lives at https://refs.drheap.org/roux2021highlevel/ and will keep doing so.