Accelerated aging with electrical overstress and prognostics for power MOSFETs
The work
| Authors | Sankalita Saha; Jose ́ R. Celaya; Vladislav A. Vashchenko; Shompa Shohiny Mahiuddin; Kai Goebel |
|---|---|
| Editors | |
| Type | misc |
| Year | 2011 |
| Citekey | saha2011accelerated |
Where it appeared
| Published in | IEEE Energytech |
|---|---|
| Pages | 1--6 |
Identifiers
| DOI | 10.1109/energytech.2011.5948532 |
|---|---|
| OpenAlex | W2113744256 |
Access
| Landing page | https://doi.org/10.1109/energytech.2011.5948532 |
|---|
From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.
Abstract
Power electronics play an increasingly important role in energy applications as part of their power converter circuits. Understanding the behavior of these devices, especially their failure modes as they age with nominal usage or sudden fault development is critical in ensuring efficiency. In this paper, a prognostics based health management of power MOSFETs undergoing accelerated aging through electrical overstress at the gate area is presented. Details of the accelerated aging methodology, modeling of the degradation process of the device and prognostics algorithm for prediction of the future state of health of the device are presented. Experiments with multiple devices demonstrate the performance of the model and the prognostics algorithm as well as the scope of application.
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-26 18:21 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@misc{saha2011accelerated,
title = {Accelerated aging with electrical overstress and prognostics for power MOSFETs},
author = {Sankalita Saha and Jose ́ R. Celaya and Vladislav A. Vashchenko and Shompa Shohiny Mahiuddin and Kai Goebel},
year = {2011},
journal = {IEEE Energytech},
pages = {1--6},
doi = {10.1109/energytech.2011.5948532},
}
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