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Laser-Induced Fault Injection on Smartphone Bypassing the Secure Boot
The work
| Authors | Aurelien Vasselle; Hugues Thiebeauld; Quentin Maouhoub; Adele Morisset; Sebastien Ermeneux |
|---|---|
| Editors | |
| Type | inproceedings |
| Year | 2017 |
| Citekey | vasselle2017laserinduced |
Where it appeared
| Published in | 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) |
|---|---|
| Publisher | IEEE |
| Pages | 41--48 |
Identifiers
| DOI | 10.1109/fdtc.2017.18 |
|---|
Access
| Landing page | https://doi.org/10.1109/fdtc.2017.18 |
|---|
How it got here
| How it got here | agent via crossref |
|---|---|
| Added | 2026-10-26 06:15 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Filed under
Cite it as
@inproceedings{vasselle2017laserinduced,
title = {Laser-Induced Fault Injection on Smartphone Bypassing the Secure Boot},
author = {Aurelien Vasselle and Hugues Thiebeauld and Quentin Maouhoub and Adele Morisset and Sebastien Ermeneux},
year = {2017},
booktitle = {2017 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC)},
publisher = {IEEE},
pages = {41--48},
doi = {10.1109/fdtc.2017.18},
}
This record lives at https://refs.drheap.org/vasselle2017laserinduced/ and will keep doing so.