The bibliographic entry was discovered and compiled by a machine, and published without a person checking it against the publication. The publication itself is the authors' own work — this badge says nothing about it.
Dielectric breakdown I: A review of oxide breakdown
The work
| Authors | J.F. Verweij; Johan H. Klootwijk |
|---|---|
| Editors | |
| Type | article |
| Year | 1996 |
| Citekey | verweij1996dielectric |
Where it appeared
| Published in | Microelectronics Journal |
|---|---|
| Publisher | Elsevier BV |
| Volume | 27 |
| Issue | 7 |
| Pages | 611--622 |
Identifiers
| DOI | 10.1016/0026-2692(95)00104-2 |
|---|---|
| OpenAlex | W1985162339 |
Access
| Landing page | https://doi.org/10.1016/0026-2692(95)00104-2 |
|---|---|
| Free full text | https://linkinghub.elsevier.com/science/article/pii/0026269295001042 |
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-26 18:33 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@article{verweij1996dielectric,
title = {Dielectric breakdown I: A review of oxide breakdown},
author = {J.F. Verweij and Johan H. Klootwijk},
year = {1996},
journal = {Microelectronics Journal},
publisher = {Elsevier BV},
volume = {27},
number = {7},
pages = {611--622},
doi = {10.1016/0026-2692(95)00104-2},
}
This record lives at https://refs.drheap.org/verweij1996dielectric/ and will keep doing so.