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IBM experiments in soft fails in computer electronics (1978–1994)
The work
| Authors | J. F. Ziegler; H. W. Curtis; H. P. Muhlfeld; C. J. Montrose; Bernard Chin; M. Nicewicz; C. A. Russell; W. Y. Wang; L. B. Freeman; P. Hosier; L. E. LaFave; J. L. Walsh; J. M. Orro; G. J. Unger; Joe Ross; T. J. O'Gorman; B. U. Messina; Tim D. Sullivan; A. J. Sykes; H. S. Yourke; T. A. Enger; Viral V. Tolat; T. S. Scott; Allison Taber; R. J. Sussman; W Klein; C. W. Wahaus |
|---|---|
| Editors | |
| Type | article |
| Year | 1996 |
| Citekey | ziegler1996ibm |
Where it appeared
| Published in | IBM Journal of Research and Development |
|---|---|
| Publisher | IBM |
| Volume | 40 |
| Issue | 1 |
| Pages | 3--18 |
Identifiers
| DOI | 10.1147/rd.401.0003 |
|---|---|
| OpenAlex | W1967835393 |
Access
| Landing page | https://doi.org/10.1147/rd.401.0003 |
|---|
From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.
Abstract
This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-26 00:22 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Filed under
Cite it as
@article{ziegler1996ibm,
title = {IBM experiments in soft fails in computer electronics (1978–1994)},
author = {J. F. Ziegler and H. W. Curtis and H. P. Muhlfeld and C. J. Montrose and Bernard Chin and M. Nicewicz and C. A. Russell and W. Y. Wang and L. B. Freeman and P. Hosier and L. E. LaFave and J. L. Walsh and J. M. Orro and G. J. Unger and Joe Ross and T. J. O'Gorman and B. U. Messina and Tim D. Sullivan and A. J. Sykes and H. S. Yourke and T. A. Enger and Viral V. Tolat and T. S. Scott and Allison Taber and R. J. Sussman and W Klein and C. W. Wahaus},
year = {1996},
journal = {IBM Journal of Research and Development},
publisher = {IBM},
volume = {40},
number = {1},
pages = {3--18},
doi = {10.1147/rd.401.0003},
}
This record lives at https://refs.drheap.org/ziegler1996ibm/ and will keep doing so.