Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation
The work
| Authors | Shekhar Y. Borkar |
|---|---|
| Editors | |
| Type | article |
| Year | 2005 |
| Citekey | borkar2005designing |
Where it appeared
| Published in | IEEE Micro |
|---|---|
| Publisher | Institute of Electrical and Electronics Engineers |
| Volume | 25 |
| Issue | 6 |
| Pages | 10--16 |
Identifiers
| DOI | 10.1109/mm.2005.110 |
|---|---|
| OpenAlex | W2125169487 |
Access
| Landing page | https://doi.org/10.1109/mm.2005.110 |
|---|
From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.
Abstract
As technology scales, variability in transistor performance continues to increase, making transistors less and less reliable. This creates several challenges in building reliable systems, from the unpredictability of delay to increasing leakage current. Finding solutions to these challenges require a concerted effort on the part of all the players in a system design. This article discusses these effects and proposes microarchitecture, circuit, and testing research that focuses on designing with many unreliable components (transistors) to yield reliable system designs.
How it got here
| How it got here | agent via openalex |
|---|---|
| Added | 2026-10-25 21:45 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Filed under
Cite it as
@article{borkar2005designing,
title = {Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation},
author = {Shekhar Y. Borkar},
year = {2005},
journal = {IEEE Micro},
publisher = {Institute of Electrical and Electronics Engineers},
volume = {25},
number = {6},
pages = {10--16},
doi = {10.1109/mm.2005.110},
}
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