Earth Mover's Distance as a Comparison Metric for Analog Behavior
The work
| Authors | Alexander W. Rath; Sebastian Simon; Volkan Esen; Wolfgang Ecker |
|---|---|
| Editors | |
| Type | inproceedings |
| Year | 2016 |
| Citekey | rath2016earth |
Where it appeared
| Published in | VLSI-SoC: Design for Reliability, Security, and Low Power. 24th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) |
|---|---|
| Publisher | Springer International Publishing |
| Pages | 173--191 |
Identifiers
| DOI | 10.1007/978-3-319-67104-8_9 |
|---|---|
| handle | hal-01675194 |
Access
| Landing page | https://inria.hal.science/hal-01675194 |
|---|
Related
| Distinct from | abuhaeyeh2026formally |
|---|---|
| Distinct from | murali2026sok |
| Distinct from | nickovic2008checking |
| Distinct from | rashid2020fasim |
From bibtex.
Abstract
Evaluating the outcome of analog simulations is a common, mostly manually carried out task in the pre-silicon verification process of mixed-signal ICs. Its non-automated nature makes it an error-prone and time-consuming procedure. For this very reason, we introduce a novel approach for performing this evaluation automatically resulting in significantly reduced turnaround times as well as a considerably increased reliability of verification results. The presented concept is motivated by an algorithm that is used in optical pattern recognition and is called Earth Mover’s Distance. Furthermore, we compare our approach with already existing algorithms, namely Fréchet Distance and Pearson Coefficient, in order to analyze its capability. Finally, we present a case study in which we prove the algorithm by applying it to the results of a mixed-signal simulation at chip-level demonstrating the efficiency of our approach.
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How it got here
| How it got here | agent via bibtex |
|---|---|
| Added | 2026-09-18 02:36 UTC |
| Not denied by | a person 2026-10-05 21:14 UTC |
Filed under
Cite it as
@inproceedings{rath2016earth,
title = {Earth Mover's Distance as a Comparison Metric for Analog Behavior},
author = {Alexander W. Rath and Sebastian Simon and Volkan Esen and Wolfgang Ecker},
year = {2016},
booktitle = {VLSI-SoC: Design for Reliability, Security, and Low Power. 24th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)},
publisher = {Springer International Publishing},
pages = {173--191},
doi = {10.1007/978-3-319-67104-8_9},
}
This record lives at https://refs.drheap.org/rath2016earth/ and will keep doing so.