Experimental Verification of Fast Voltage Droop Correction Circuits

The work

AuthorsShreyas Srinivas; Ian W. Jones; Carsten Schulze; Milos Krstic; Christoph Lenzen
Editors
Typemisc
Year2026
Citekeysrinivas2026experimental

Identifiers

arXiv2608.19954 from its landing_page_url

Related

Distinct frombund2019optimal
Distinct frombund2020synchronizerfree
Distinct fromfriedrichs2018metastabilitycontaining
Distinct fromfugger2019faithful
Distinct fromfugger2022fast
Distinct frommarino1981general
Distinct fromsrinivas2025latch

From bibtex.

Abstract

Due to the trend towards minimizing guard bands for energy saving purposes, voltage droops are a key limiting factor for the operational frequency of today's VLSI circuits. Adapting clock frequencies dynamically presents the challenge of metastability in the device that detects and stores the existence of voltage droops. We present an implementation of a fast all-digital circuit for adaptive response to droops using the IHP 130 nm process. The description of the design is presented in an accompanying paper. We experimentally validate the functionality of the design on a test chip.

A copy is held

pdf, 14.0 MB. Not published — it may be under copyright. The facts and links here are.

How it got here

How it got hereagent via bibtex
Added2026-09-16 05:22 UTC
Approved bya person 2026-09-16 09:10 UTC

Cite it as

@misc{srinivas2026experimental,
  title        = {Experimental Verification of Fast Voltage Droop Correction Circuits},
  author       = {Shreyas Srinivas and Ian W. Jones and Carsten Schulze and Milos Krstic and Christoph Lenzen},
  year         = {2026},
}

This record lives at https://refs.drheap.org/srinivas2026experimental/ and will keep doing so.