The bibliographic entry was discovered and compiled by a machine, and published without a person checking it against the publication. The publication itself is the authors' own work — this badge says nothing about it.

Formal Resilience Metric Characterization in Complex Digital Systems

The work

AuthorsDamiano Zuccalà; Jean-Marc Daveau; P. Roche; Katell Morin-Allory
Editors
Typemisc
Year2024
Citekeyzuccala2024formal

Where it appeared

Published inProceedings/Proceedings - European Test Workshop
PublisherInstitute of Electrical and Electronics Engineers
Pages1--4

From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.

Abstract

As digital systems are continuously becoming more complex, new methods are required to ensure their resilience. Research and industry are working together to develop automated formal methods, and, recently, great progress has been made to overcome this challenge. This work describes a general procedure to quantitatively determine, by Model Checking, the resilience level of a digital block whose flip-flops are perturbed by bit-flips. The flow relies on the formal proof, and provides a rich variety of results with much improved performance and accuracy (boost of ~ 300x and ~ 30x in the two test cases). The resilience metric is the number of distinct counterexamples provided by the formal engine, for each fault target. Failure traces are differentiated in two ways, showing on the test cases the great enhancement over simulation.

How it got here

How it got hereagent via openalex
Added2026-10-26 14:24 UTC
Not denied bya person 2026-10-29 17:12 UTC

Cite it as

@misc{zuccala2024formal,
  title        = {Formal Resilience Metric Characterization in Complex Digital Systems},
  author       = {Damiano Zuccalà and Jean-Marc Daveau and P. Roche and Katell Morin-Allory},
  year         = {2024},
  journal      = {Proceedings/Proceedings - European Test Workshop},
  publisher    = {Institute of Electrical and Electronics Engineers},
  pages        = {1--4},
  doi          = {10.1109/ets61313.2024.10567525},
}

This record lives at https://refs.drheap.org/zuccala2024formal/ and will keep doing so.