P. Roche
4 references under this name, matched as it is written. Somebody else may write under it too, and the same person may appear here spelled another way.
Formal Resilience Metric Characterization in Complex Digital Systems
Damiano Zuccalà and others (2024) · Proceedings/Proceedings - European Test Workshop · Institute of Electrical and Electronics Engineers
Formal Temporal Characterization of Register Vulnerability in Digital Circuits
D. Zuccalà and others (2023) · IEEE
Detailed SET Measurement and Characterization of a 65 nm Bulk Technology
Maximilien Glorieux and others (2017) · IEEE Transactions on Nuclear Science · Institute of Electrical and Electronics Engineers
SEE test and modeling results on 45nm SRAMs with different well strategies
Gilles Gasiot and others (2010) · IEEE International Reliability Physics Symposium proceedings · Institute of Electrical and Electronics Engineers