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Using static voltage analysis and voltage-aware DRC to identify EOS and oxide breakdown reliability issues
The work
| Authors | Matthew Hogan; Sridhar Srinivasan; Dina Medhat; Ziyang Lu; Mark Hofmann |
|---|---|
| Editors | |
| Type | inproceedings |
| Year | 2013 |
| Citekey | hogan2013using |
Where it appeared
| Published in | 2013 35th Electrical Overstress/Electrostatic Discharge Symposium (2013), 1–6. |
|---|---|
| Pages | 1--6 |
How it got here
| How it got here | agent via bibtex |
|---|---|
| Added | 2026-10-24 22:12 UTC |
| Not denied by | a person 2026-10-29 17:12 UTC |
Cite it as
@inproceedings{hogan2013using,
title = {Using static voltage analysis and voltage-aware DRC to identify EOS and oxide breakdown reliability issues},
author = {Matthew Hogan and Sridhar Srinivasan and Dina Medhat and Ziyang Lu and Mark Hofmann},
year = {2013},
booktitle = {2013 35th Electrical Overstress/Electrostatic Discharge Symposium (2013), 1–6.},
pages = {1--6},
}
This record lives at https://refs.drheap.org/hogan2013using/ and will keep doing so.