Boolean Analysis of MOS Circuits
The work
| Authors | Randal E. Bryant |
|---|---|
| Editors | |
| Type | article |
| Year | 1987 |
| Citekey | bryant1987boolean |
Where it appeared
| Published in | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
|---|---|
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Volume | 6 |
| Issue | 4 |
| Pages | 634--649 |
Identifiers
| DOI | 10.1109/tcad.1987.1270310 |
|---|---|
| ISSN | 0278-0070 |
Related
| Distinct from | bryant1981switchlevel |
|---|---|
| Distinct from | bryant1982mossim |
| Distinct from | bryant1985symbolic |
| Distinct from | bryant1986graphbased |
| Distinct from | bryant1987algorithmic |
| Distinct from | bryant1987cosmos |
| Distinct from | bryant1991extraction |
| Distinct from | bryant2018binary |
| Distinct from | dhingra1987formal |
| Distinct from | fugger2016unfaithful |
| Distinct from | leeser1988reasoning |
| Distinct from | seger1995formal |
From crossref.
Abstract
The switch-level model represents a digital metal-oxide semiconductor (MOS) circuit as a network of charge storage nodes connected by resistive transistor switches. The functionality of such a network can be expressed as a series of systems of Boolean equations. Solving these equations symbolically yields a set of Boolean formulas that describe the mapping from input and current state to the new network state. This analysis supports the same class of networks as the switch-level simulator MOSSIM II and provides the same functionality, including the handling of bidirectional effects and indeterminate (X) logic values. In the worst case, the analysis of an n node network can yield a set of formulas containing a total of O(n^3) operations. However, all but a limited set of dense, pass-transistor networks give formulas with O(n) total operations. The analysis can serve as the basis of efficient programs for a variety of logic design tasks, including: logic simulation (on both conventional and special purpose computers), fault simulation, test generation, and symbolic verification.
A copy is held
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How it got here
| How it got here | agent via crossref |
|---|---|
| Added | 2026-09-16 01:54 UTC |
| Approved by | a person 2026-09-23 14:13 UTC |
Cite it as
@article{bryant1987boolean,
title = {Boolean Analysis of MOS Circuits},
author = {Randal E. Bryant},
year = {1987},
journal = {IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
volume = {6},
number = {4},
pages = {634--649},
issn = {0278-0070},
doi = {10.1109/tcad.1987.1270310},
}
This record lives at https://refs.drheap.org/bryant1987boolean/ and will keep doing so.