Electrical Rule Checking of Integrated Circuits using Satisfiability Modulo Theory
The work
| Authors | Bruno Ferres; Oussama Oulkaid; Ludovic Henrio; M. Khosravian G.; Matthieu Moy; Gabriel Radanne; Pascal Raymond |
|---|---|
| Editors | |
| Type | misc |
| Year | 2023 |
| Citekey | ferres2023electrical |
Where it appeared
| Pages | 1--2 |
|---|
Identifiers
| DOI | 10.23919/date56975.2023.10137147 |
|---|---|
| OpenAlex | W4322632509 |
Access
| Landing page | https://doi.org/10.23919/date56975.2023.10137147 |
|---|
Related
| Distinct from | biere1999symbolic |
|---|---|
| Distinct from | bryant1982mossim |
| Distinct from | bryant1991methodology |
| Distinct from | dhingra1987formal |
| Distinct from | elshehaby2023susceptibility |
| Distinct from | ferres2025survey |
| Distinct from | leeser1988reasoning |
| Distinct from | mateescu2020modeling |
| Distinct from | oulkaid2024transistor |
| Distinct from | oulkaid2025modeles |
| Distinct from | peng2015extending |
| Distinct from | plassanconclusive |
| Distinct from | winskel1987relating |
From OpenAlex, which stores abstracts as an index of words and their positions: what is shown is rebuilt from that, and reads fluently whether or not it is what the author wrote.
Abstract
We consider the verification of electrical properties of circuits to identify potential violations of electrical design rules, also called Electrical Rule Checking (ERC). We present a general approach based on Satisfiability Modulo Theory (SMT) to verify that these errors cannot occur in a given circuit. We claim that our approach is scalable and more precise than existing analyses, like voltage propagation. We applied these techniques to a specific type of errors, the missing level shifters. On an industrial case-study, our technique is able to flag 31 % of the warnings raised by the voltage propagation analysis as being false alarms.
Cite it as
@misc{ferres2023electrical,
title = {Electrical Rule Checking of Integrated Circuits using Satisfiability Modulo Theory},
author = {Bruno Ferres and Oussama Oulkaid and Ludovic Henrio and M. Khosravian G. and Matthieu Moy and Gabriel Radanne and Pascal Raymond},
year = {2023},
pages = {1--2},
doi = {10.23919/date56975.2023.10137147},
}
This record lives at https://refs.drheap.org/ferres2023electrical/ and will keep doing so.