A Survey on Transistor-Level Electrical Rule Checking of Integrated Circuits

The work

AuthorsBruno Ferres; Oussama Oulkaid; Matthieu Moy; Gabriel Radanne; Ludovic Henrio; Pascal Raymond; Mehdi Khosravian
Editors
Typearticle
Year2025
Citekeyferres2025survey

Where it appeared

Published inACM Transactions on Design Automation of Electronic Systems
PublisherAssociation for Computing Machinery (ACM)
Volume30
Issue5
Pages1--28

Identifiers

DOI10.1145/3748327
OpenAlexW4412363073
ISSN1084-4309

Related

Distinct frombasin1991formally
Distinct frombloem2018formal
Distinct frombryant1982mossim
Distinct frombuchanan1980modelling
Distinct fromcabodi2016hardware
Distinct fromferres2023electrical
Distinct fromfriedrichs2018metastabilitycontaining
Distinct fromfugger2019faithful
Distinct fromoulkaid2024transistor
Distinct fromoulkaid2025modeles
Distinct fromoulkaid2026modeling
Distinct fromplassanconclusive
Distinct fromwinskel1987relating
Distinct fromwong1993formal
Distinct fromzhu2026equivfusion

From crossref.

Abstract

Hardware verification is crucial to ensure the quality of Integrated Circuits, and prevent costly bugs down the manufacturing flow. Electrical Rule Checking (ERC) is a verification step used to assert that a circuit complies with some electrical rules, from the absence of short-circuits to dedicated constructor rules. In this survey, we provide a global overview of existing ERC techniques at transistor-level, where voltage values are explicit. We propose a new classification method to compare the existing approaches based on their semantic modeling of circuits. This survey precisely describes transistor-level ERC research challenges and existing solutions. We believe it will help structure this research domain by positioning existing approaches with respect to each other. Obviously, a survey should also facilitate technological transfer and this one should help CAD vendors identify the most relevant approaches to integrate in their tools. Finally, we highlight several promising directions to improve the existing solutions.

A copy is held

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How it got here

How it got hereagent via crossref
Added2026-09-16 00:58 UTC
Approved bya person 2026-09-16 09:17 UTC

Cite it as

@article{ferres2025survey,
  title        = {A Survey on Transistor-Level Electrical Rule Checking of Integrated Circuits},
  author       = {Bruno Ferres and Oussama Oulkaid and Matthieu Moy and Gabriel Radanne and Ludovic Henrio and Pascal Raymond and Mehdi Khosravian},
  year         = {2025},
  journal      = {ACM Transactions on Design Automation of Electronic Systems},
  publisher    = {Association for Computing Machinery (ACM)},
  volume       = {30},
  number       = {5},
  pages        = {1--28},
  issn         = {1084-4309},
  doi          = {10.1145/3748327},
}

This record lives at https://refs.drheap.org/ferres2025survey/ and will keep doing so.