A Survey on Transistor-Level Electrical Rule Checking of Integrated Circuits
The work
| Authors | Bruno Ferres; Oussama Oulkaid; Matthieu Moy; Gabriel Radanne; Ludovic Henrio; Pascal Raymond; Mehdi Khosravian |
|---|---|
| Editors | |
| Type | article |
| Year | 2025 |
| Citekey | ferres2025survey |
Where it appeared
| Published in | ACM Transactions on Design Automation of Electronic Systems |
|---|---|
| Publisher | Association for Computing Machinery (ACM) |
| Volume | 30 |
| Issue | 5 |
| Pages | 1--28 |
Identifiers
| DOI | 10.1145/3748327 |
|---|---|
| OpenAlex | W4412363073 |
| ISSN | 1084-4309 |
Access
| Landing page | https://doi.org/10.1145/3748327 |
|---|---|
| Free full text | https://dl.acm.org/doi/pdf/10.1145/3748327 |
Related
| Distinct from | basin1991formally |
|---|---|
| Distinct from | bloem2018formal |
| Distinct from | bryant1982mossim |
| Distinct from | buchanan1980modelling |
| Distinct from | cabodi2016hardware |
| Distinct from | ferres2023electrical |
| Distinct from | friedrichs2018metastabilitycontaining |
| Distinct from | fugger2019faithful |
| Distinct from | oulkaid2024transistor |
| Distinct from | oulkaid2025modeles |
| Distinct from | oulkaid2026modeling |
| Distinct from | plassanconclusive |
| Distinct from | winskel1987relating |
| Distinct from | wong1993formal |
| Distinct from | zhu2026equivfusion |
From crossref.
Abstract
Hardware verification is crucial to ensure the quality of Integrated Circuits, and prevent costly bugs down the manufacturing flow. Electrical Rule Checking (ERC) is a verification step used to assert that a circuit complies with some electrical rules, from the absence of short-circuits to dedicated constructor rules. In this survey, we provide a global overview of existing ERC techniques at transistor-level, where voltage values are explicit. We propose a new classification method to compare the existing approaches based on their semantic modeling of circuits. This survey precisely describes transistor-level ERC research challenges and existing solutions. We believe it will help structure this research domain by positioning existing approaches with respect to each other. Obviously, a survey should also facilitate technological transfer and this one should help CAD vendors identify the most relevant approaches to integrate in their tools. Finally, we highlight several promising directions to improve the existing solutions.
Cite it as
@article{ferres2025survey,
title = {A Survey on Transistor-Level Electrical Rule Checking of Integrated Circuits},
author = {Bruno Ferres and Oussama Oulkaid and Matthieu Moy and Gabriel Radanne and Ludovic Henrio and Pascal Raymond and Mehdi Khosravian},
year = {2025},
journal = {ACM Transactions on Design Automation of Electronic Systems},
publisher = {Association for Computing Machinery (ACM)},
volume = {30},
number = {5},
pages = {1--28},
issn = {1084-4309},
doi = {10.1145/3748327},
}
This record lives at https://refs.drheap.org/ferres2025survey/ and will keep doing so.